Technical Program

Paper Detail

Paper Title Rates of Adaptive Group Testing in the Linear Regime
Paper IdentifierMO2.R4.2
Authors Matthew Aldridge, University of Leeds, United Kingdom
Session Testing and Classification I
Location Odéon, Level 3
Session Time Monday, 08 July, 11:40 - 13:00
Presentation Time Monday, 08 July, 12:00 - 12:20
Manuscript  Click here to download the manuscript
Abstract We consider adaptive group testing in the linear regime, where the number of defective items scales linearly with the number of items. We analyse an algorithm based on generalized binary splitting. Provided fewer than half the items are defective, we achieve rates of over 0.9 bits per test for combinatorial zero-error testing, and over 0.95 bits per test for probabilistic small-error testing.